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Microstructure of Eobania vermiculata (Müller, 1774): SEM, F-TIR and XRD Methods
(Prensip Yayıncılık, 2022)
In this study, Scanning electron microscope (SEM), Fourier transform infrared spectroscopy (FTIR), and X-ray diffraction (XRD) analyses are used for the microstructure characterisation of Eobania vermiculata samples collected ...