Yayıncı "Taylor & Francis Inc" Araştırma Çıktıları | Scopus İndeksli Yayınlar Koleksiyonu için listeleme
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Characterization of atomic layer deposition coated cutting tools by X-ray photoelectron spectroscopy and examination of cutting performance
(Taylor & Francis Inc, 2019)The performance of cutting tools was examined, involving synthesis of a 10 nm thin film of Aluminum oxide using atomic layer deposition. Characterization of coated and uncoated cutting tools was done by several methods. ... -
Semi-empirical determination of Kα1,2, Kβ1,3, and Kβ2,4 X-ray natural line widths for various elements between 29 ≤ Z ≤ 74 at 123.6 keV
(Taylor & Francis Inc, 2019)In this study, K-alpha 1,K-2, K-beta 1,K-3, and K-beta 2,K-4 X-ray natural line widths for various elements were determined semi-empirically at 123.6 keV by using K shell fluorescence yields obtained from energy dispersive ...