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Characterization of atomic layer deposition coated cutting tools by X-ray photoelectron spectroscopy and examination of cutting performance

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Date

2019

Author

Bahçeci, Ersin

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Citation

Bahceci, E. (2019). Characterization of atomic layer deposition coated cutting tools by X-ray photoelectron spectroscopy and examination of cutting performance. Spectroscopy Letters, 52 (8), pp. 456-461. https://doi.org/10.1080/00387010.2019.1660901

Abstract

The performance of cutting tools was examined, involving synthesis of a 10 nm thin film of Aluminum oxide using atomic layer deposition. Characterization of coated and uncoated cutting tools was done by several methods. scanning electron microscopy was used and the images were compared with each other. Chemical characterization was performed by X-ray diffraction and X-ray photoelectron spectroscopy. Coated and uncoated cutting tools were tested with steel material in turning tests. After turning, it was observed that the adhesion effect was reduced to a large extent in turning with coated tool. It was observed that the coating showed stability at high temperatures during cutting and the cutting performance was increased. The main advantage of the coating was that the tools produced were more environmentally friendly, with a longer useful life and they were easier to recycle.

Source

Spectroscopy Letters

Volume

52

Issue

8

URI

https://doi.org/10.1080/00387010.2019.1660901
https://hdl.handle.net/20.500.12508/1184

Collections

  • Araştırma Çıktıları | Scopus İndeksli Yayınlar Koleksiyonu [1420]
  • Araştırma Çıktıları | Web of Science İndeksli Yayınlar Koleksiyonu [1460]
  • Makale Koleksiyonu [151]



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